TITLE: Soft matter at and beyond the limits of soft x-ray microscopy 
SPEAKER: Prof. Rainer Fink, University of Erlangen (FAU), Germany

TIME:July 24 (Friday)AM10:30 
LOCATION: 518 Meeting Room, Chemistry Building A (化学A楼518会议室) 
INVITER: Prof. Yongfeng Zhou (周永丰教授)
 

Abstract: Zone-plate based soft x-ray microspectroscopy has developed into a routine technique to analysing all kind of materials. Specifically the investigation of organic materials gains from the chemical fingerprint sensitivity of near-edge x-ray absorption fine structure (NEXAFS). We will discuss various applications of the PolLux-STXM operated at the Swiss Light Source. Soft matter specimens range from polymer materials, polymer blends, organic nanocrystals and organic electronic thin film devices. Since spatial resolution in state-of-the-art zone plate-based microscopy is limited, complementary techniques are required that offer chemical insight also beyond the present STXM resolution level. Therefore, soft x-ray resonant scattering has been employed to resolve structures in the sub-10 nm regime.